Title :
Single Event Induced Multiple Bit Errors and the Effects of Logic Masking
Author :
Berg, Melanie D. ; Kim, Hak S. ; Phan, Anthony D. ; Seidlick, Christina M. ; LaBel, Kenneth A. ; Pellish, Jonathan A.
Author_Institution :
ASRC Fed. Space & Defense, Greenbelt, MD, USA
Abstract :
We apply a model and heavy-ion cross section data to predict the potential that one single event upset (SEU) will induce multiple bit errors (MBEs) by the next clock-cycle of a synchronous design.
Keywords :
field programmable gate arrays; radiation effects; FPGA; MBEs; SEU; clock-cycle; field programmable gate array; heavy-ion cross section data; logic masking effect; single event induced multiple bit errors; synchronous design; Error analysis; Field programmable gate arrays; Single event transients; Single event upsets; Field programmable gate array (FPGA); single event transient (SET); single event upset (SEU); synchronous design;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2013.2290753
