All-optical logic gate using waveguide-type SPR with Au/ZnO plasmon stack

Author

Oh, Geum-Yoon ; Kim, Doo Gun ; Choi, Young-Wan

Author_Institution

Sch. of Electr. & Electron. Eng., Chung-Ang Univ., Seoul, South Korea

fYear

2010

fDate

5-9 July 2010

Firstpage

374

Lastpage

375

Abstract

We have proposed a novel all-optical logic gates based on surface plasmon resonance. The waveguide-type Kretchmann-Raether configuration with high sensitivity on the metal surface was used for all-optical logic gate. When the external light source is injected into the thin ZnO film deposited on the facet of a GaAs waveguide, the refractive index of the thin ZnO layer is changed by the absorption of external light. The proposed waveguide-type configuration is analyzed and optimized using finite-difference time-domain method for all-optical OR and NAND gates.

Keywords

II-VI semiconductors; III-V semiconductors; finite difference time-domain analysis; gallium arsenide; gold; optical logic; optical waveguides; refractive index; semiconductor thin films; surface plasmon resonance; wide band gap semiconductors; zinc compounds; Au-ZnO; GaAs; SPR; all-optical NAND gate; all-optical OR gate; all-optical logic gate; external light source; finite-difference time-domain method; metal surface; plasmon stack; refractive index; surface plasmon resonance; thin film; waveguide-type Kretchmann-Raether configuration; Logic gates; Nonlinear optics; Optical sensors; Optical waveguides; Refractive index; Surface waves; Zinc oxide;

fLanguage

English

Publisher

ieee

Conference_Titel

OptoElectronics and Communications Conference (OECC), 2010 15th

Conference_Location

Sapporo

Print_ISBN

978-1-4244-6785-3

Type

conf

Filename

5588593