• DocumentCode
    52839
  • Title

    Feedback Power Control with Bit Error Outage Probability QoS Measure on the Rayleigh Fading Channel

  • Author

    Peijie Wang ; Pooi-Yuen Kam

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore
  • Volume
    61
  • Issue
    4
  • fYear
    2013
  • fDate
    Apr-13
  • Firstpage
    1621
  • Lastpage
    1631
  • Abstract
    We propose to use the probability of instantaneous bit error outage (IBEO) as a new performance measure in the design of an actual feedback power control system. It is defined as the probability that the instantaneous bit error probability (IBEP) exceeds an IBEP threshold. We propose the IBEO-based power control law where the transmitted power is adjusted according to the variations of the channel such that the IBEO probability is kept within some quality of service (QoS)-specified threshold. It ensures that in the long term, no more than a certain fraction of received bits would have IBEP exceeding some IBEP threshold. Therefore, the instantaneous QoS is guaranteed. Based on a practical system model with channel estimation and prediction, we develop the traditional average bit error probability (ABEP)-based power control law and the new IBEO-based power control law. For both laws, we derive explicit ABEP and IBEO probability results. The IBEO-based law shows a remarkable gain over the ABEP-based law in terms of IBEO probability, and sacrifices only a little in the ABEP performance.
  • Keywords
    Rayleigh channels; error statistics; quality of service; ABEP; IBEO probability; IBEO-based law; IBEP; QoS-specified threshold; Rayleigh fading channel; average bit error probability; bit error outage probability; feedback power control; instantaneous bit error outage; quality of service; Channel estimation; Fading; Power control; Quality of service; Random variables; Receivers; Transmitters; Feedback power control; average bit error probability; channel state information; instantaneous QoS; instantaneous bit error outage probability;
  • fLanguage
    English
  • Journal_Title
    Communications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0090-6778
  • Type

    jour

  • DOI
    10.1109/TCOMM.2013.020813.120124
  • Filename
    6461029