DocumentCode
528615
Title
Analog IC fault diagnosis by means of supply current monitoring in test points selected evolutionarily
Author
Golonek, Tomasz ; Grzechca, Damian ; Rutkowski, Jerzy
Author_Institution
Inst. of Electron., Silesian Univ. of Technol., Gliwice, Poland
fYear
2010
fDate
7-10 Sept. 2010
Firstpage
397
Lastpage
400
Abstract
This paper describes the technique dedicated to an analog integrated circuit testing by means of supply current monitoring. The minimal set of test points, that allows to achieve the highest possible fault coverage, is determined with the use of genetic algorithm. Thanks to the proposed dynamic scheme of phenotype coding, the optimization process is more efficient than for a standard, static genotype structure realization.
Keywords
analogue integrated circuits; fault diagnosis; genetic algorithms; integrated circuit testing; analog IC fault diagnosis; analog integrated circuit testing; fault coverage; genetic algorithm; optimization process; phenotype coding; supply current monitoring; Circuit faults; Encoding; Gallium; Monitoring; Optimization; Testing; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Signals and Electronic Systems (ICSES), 2010 International Conference on
Conference_Location
Gliwice
Print_ISBN
978-1-4244-5307-8
Electronic_ISBN
978-83-9047-4-2
Type
conf
Filename
5595160
Link To Document