An analogue integrated circuits yield optimisation with the use of genetic algorithm

Design for Manufacturability and Yield is one of the most important concepts in analogue integrated circuits manufacturing. The process of adjusting the nominal values of circuit parameters allows for partial immunisation of its performance against deviations in value of the circuit´s parameters. This paper proposes the use of an evolutionary tool, the genetic algorithm, for design centring. The process is based on encompassing an assumed integrated model and Monte Carlo analysis. The presented design centring method has been verified with the use of an example circuit, i.e. a CMOS operational amplifier.