• DocumentCode
    528787
  • Title

    MODEST: A model for energy estimation under spatio-temporal variability

  • Author

    Ganapathy, Shrikanth ; Canal, Ramon ; Gonzalez, Antonio ; Rubio, Antonio

  • Author_Institution
    Department d´´Arquitectura de Computadors, Universitat Politècnica de Catalunya, Barcelona, Spain
  • fYear
    2010
  • fDate
    18-20 Aug. 2010
  • Firstpage
    129
  • Lastpage
    134
  • Abstract
    Estimation of static and dynamic energy of caches is critical for high-performance low-power designs. Commercial CAD tools performing energy estimation statically are not aware of the changing operating and environmental conditions which makes the problem of energy estimation more dynamic in nature. It is worsened by process induced variations of low level parameters like threshold voltage and channel length. In this paper we present MODEST, a proposal for estimating the static and dynamic energy of caches taking into account spatial variations of physical parameters, temporal changes of supply voltage and environmental factors like temperature. It can be used to estimate the energy of different blocks of a cache based on a combination empirical data and analytical equations. The observed maximum and median error between MODEST and HSPICE energy-estimates for 22,500 samples is around 7.8% and 0.5% respectively. As a case study, using MODEST, we propose a two step iterative optimization procedure involving Dual-Vth assignment and standby supply voltage minimization for reclaiming energy-constrained caches. The observed energy reduction is around 50.8% for the most-leaky Cache. A speed-up of 750X over conventional hard-coded implementation for such optimizations is achieved.
  • Keywords
    Analytical models; Computational modeling; Delay; Equations; Estimation; Integrated circuit modeling; Mathematical model; Cache Design; DSM Scaling; Spatio-Temporal Variability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Low-Power Electronics and Design (ISLPED), 2010 ACM/IEEE International Symposium on
  • Conference_Location
    Austin, TX, USA
  • Print_ISBN
    978-1-4244-8588-8
  • Type

    conf

  • Filename
    5599009