DocumentCode :
528817
Title :
VAIL: Variation-aware issue logic and performance binning for processor yield and profit improvement
Author :
Paul, Somnath ; Bhunia, Swarup
Author_Institution :
Case Western Reserve Univ., Cleveland, Ohio, USA
fYear :
2010
fDate :
18-20 Aug. 2010
Firstpage :
37
Lastpage :
42
Abstract :
With increasing parameter variations, functional units (FUs) in a chip experience considerable local variations in maximum operating frequency. Effect of such within-die variations in a superscalar processor if addressed by worst-case frequency assignment, results in overly pessimistic yield in high-frequency bins. In this paper, we propose VAIL — a novel low-overhead instruction scheduling strategy that assigns best-case frequency by issuing the narrow-width (NW) operations to slower units. This exploits the abundance of NW operations (>70%) in a typical program and the fact that the critical path in FUs are not activated for these operations. Compared to existing vari-cycle approach, the proposed scheme demonstrates a large improvement in yield (∼ 27% at highest performance bin) and profit (10–15%) for a set of benchmark applications. It also improves the thermal profile for the FUs. Finally, it provides large opportunistic power saving (∼ 43%) in the slow units using supply gating of inactive bit-slices.
Keywords :
Adders; Benchmark testing; Degradation; Delay; Hardware; Logic gates; Throughput; Superscalar processor; Within-die variation; narrow-width operand;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Low-Power Electronics and Design (ISLPED), 2010 ACM/IEEE International Symposium on
Conference_Location :
Austin, TX, USA
Print_ISBN :
978-1-4244-8588-8
Type :
conf
Filename :
5599039
Link To Document :
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