Title :
0.5-V operation variation-aware word-enhancing cache architecture using 7T/14T hybrid SRAM
Author :
Nakata, Yohei ; Okumura, Shunsuke ; Kawaguchi, Hiroshi ; Yoshimoto, Masahiko
Author_Institution :
Graduate School of System Informatics, Kobe University, Kobe, Japan
Abstract :
This paper presents a novel cache architecture using 7T/14T hybrid SRAM, which can dynamically improve its reliability with control lines. Our proposed 14T word-enhancing scheme can enhance its operating margin in word granularity by combining two words in a low-voltage mode. The proposed scheme is suitable for dynamic voltage and frequency scaling (DVFS). In a 65-nm process, it can reduce the minimum operation voltage (Vmin) to 0.5 V, which is 42% and 21% lower, respectively, than the conventional 6T SRAM and the cache word-disable scheme. The respective power reductions are 90% and 65%.
Keywords :
Bit error rate; Error correction codes; Random access memory; Redundancy; Transistors; Cache memory; fine-grain control; low power; low voltage; microarchitecture; variation;
Conference_Titel :
Low-Power Electronics and Design (ISLPED), 2010 ACM/IEEE International Symposium on
Conference_Location :
Austin, TX, USA
Print_ISBN :
978-1-4244-8588-8