• DocumentCode
    528961
  • Title

    The exploration of B2B e-auction adaptation strategy in Taiwan

  • Author

    Yu, Ya-Wen ; Lin, Ya-Ti ; Chen, Yung-Hsin ; Chen, James K C

  • Author_Institution
    Dept. of Bus. Adm., Asia Univ., Taichung, Taiwan
  • fYear
    2010
  • fDate
    18-22 July 2010
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    Business-To-Business (B2B) electronic-auction (e-auction) has become a popular tool in the business transaction process. However, there are several reasons that cause companies in Taiwan to be reluctant in using this tool. In this empirical paper, it provides a more distinctive direction to enhance the benefit and operational efficiency when seeking the use of e-auction. The obstacles for applying e-auction have been explored based on expert interviews and research data found from some high-tech firms in Taiwan. Decision-making trial and evaluation laboratory (DEMATEL) method has been utilized to evaluate the connection and relationship among the four criteria, which influence decision-making of e-auction adoption. The purpose of utilizing DEMATEL is to realize the relationship between all criteria, as well as finding the optimal solution for firms to adapt to e-auction. The research outcome reveals that the criterion of Internal Resistances is the primary factor that influences the adoption of e-auction, while Operational Costs and External Resistances tend to be affected by Internal Resistances. The results of this research can be used to support firms in implementing e-auction tool more efficiently and gain the most benefit consequently.
  • Keywords
    decision making; electronic commerce; transaction processing; B2B e-auction adaptation strategy; DEMATEL method; Taiwan; business transaction process; decision making trial and evaluation laboratory; electronic auction; external resistances criterion; internal resistances criterion; operational costs criterion; operational efficiency; optimal solution; Equations; Mathematical model; Personnel; Procurement; Reliability; Resistance; Software;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Technology Management for Global Economic Growth (PICMET), 2010 Proceedings of PICMET '10:
  • Conference_Location
    Phuket
  • Print_ISBN
    978-1-4244-8203-0
  • Electronic_ISBN
    978-1-890843-21-2
  • Type

    conf

  • Filename
    5602058