Title :
The research on the automatic measurement of frequency characteristics of opto-electronic platform
Author :
Liu, Hui ; Gao, Siyuan ; Liu, Bo ; Chen, Juan ; Jia, Hongguang ; Liang, Wei
Author_Institution :
Changchun Inst. of Opt., Fine Mech. & Phys., Chinese Acad. of Sci., Changchun, China
Abstract :
A new frequency characteristic test method is proposed based on the digitization characteristics of optoelectronic platform servo system. First a digital processing controller is used to automatically test the entire process and tested data are uploaded to a PC through CAN-bus, and then the tested data are transferred into accurate transfer function with the Levy method. Here we discuss the testing steps, the data processing, the extraction, the Bode diagram plotting and the model identification in detail. The corresponding experiments are carried out, and the results show that the method is simple with the features of high efficiency, high precision and engineering feasibility.
Keywords :
Bode diagrams; controller area networks; digital control; field buses; frequency measurement; optoelectronic devices; servomechanisms; transfer functions; Bode diagram; CAN bus; Levy method; digital processing controller; frequency characteristic measurement; opto-electronic platform; servo system; transfer function; Digital signal processing; Linearity; Testing; Levy identification; correlation analysis; frequency characteristics measurement; opto-electronic platform;
Conference_Titel :
Computer, Mechatronics, Control and Electronic Engineering (CMCE), 2010 International Conference on
Conference_Location :
Changchun
Print_ISBN :
978-1-4244-7957-3
DOI :
10.1109/CMCE.2010.5610123
