DocumentCode
530757
Title
Trace elements measurement based on stroboscope technology
Author
Ji, Zou ; Lirong, Wang
Author_Institution
Electron. & Inf. Eng. Coll., Changchun Univ., Jilin, China
Volume
3
fYear
2010
fDate
24-26 Aug. 2010
Firstpage
296
Lastpage
299
Abstract
Stroboscope method is a non-contact detecting technique through analyzing objects luminous radiation characteristic when the objects are excited by external source such as visible light, X-ray, γ-ray and electron beam etc. By analyzing the excited parameters, we can obtain the trace elements characteristics plot. The experimental results indicate that the measurement has more accuracy and sensitivity.
Keywords
chemical variables measurement; stroboscopes; luminous radiation; noncontact detecting technique; stroboscope; trace element measurement; Equations; Pollution measurement; Sensitivity; Silicon; Elements measuring; excited parameters; external excited; non-contact detecting; stroboscope;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer, Mechatronics, Control and Electronic Engineering (CMCE), 2010 International Conference on
Conference_Location
Changchun
Print_ISBN
978-1-4244-7957-3
Type
conf
DOI
10.1109/CMCE.2010.5610331
Filename
5610331
Link To Document