• DocumentCode
    530815
  • Title

    Research on auto measurement system of phase retardation of wave plates based on LabVIEW

  • Author

    Yanhao, Lin ; Xiaosheng, Qu ; Dongguang, Wang ; Jiaben, Lin ; Keliang, Hu

  • Author_Institution
    Sch. of Electron. & Inf. Eng., Beihang Univ., Beijing, China
  • Volume
    3
  • fYear
    2010
  • fDate
    24-26 Aug. 2010
  • Firstpage
    29
  • Lastpage
    32
  • Abstract
    The original measurement system of wave-plates phase retardation is non-automated, low efficiency and not suitable for a large scale wave-plate measurement. In order to solving these problems, this paper designed an auto measurement system of phase retardation of wave plates based on LabVIEW, computer, PCI-1753 digital I/O card, and some photoelectric conversion instrument. The hardware part of it is composed of a digital I/O card, 3 degree-measurement numeral display meters and a photocurrent meter. The system software is developed with LabVIEW. This paper implements the functions of synchronic data acquisition, data display and charting, motor control, data processing, and auto measuring, so an integrated, automated, high-accuracy measurement system of wave plates is established, and the efficiency of wave plates measurement were improved substantially.
  • Keywords
    data acquisition; photoelectric devices; virtual instrumentation; 3 degree measurement numeral display meters; LabVIEW; PCI-1753 digital I/O card; auto measurement system; data processing; digital I/O card; large scale wave plate measurement; photocurrent meter; photoelectric conversion instrument; synchronic data acquisition; wave plates phase retardation; Educational institutions; Extraterrestrial measurements; Manuals; Photoconductivity; Variable speed drives; LabVIEW; data acquisition; digital I/O card; polarization; wave plates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer, Mechatronics, Control and Electronic Engineering (CMCE), 2010 International Conference on
  • Conference_Location
    Changchun
  • Print_ISBN
    978-1-4244-7957-3
  • Type

    conf

  • DOI
    10.1109/CMCE.2010.5610411
  • Filename
    5610411