DocumentCode
530930
Title
A non linear power HEMT model operating in multi-bias conditions
Author
Charbonniaud, C. ; Xiong, A. ; Dellier, S. ; Jardel, O. ; Quéré, R.
Author_Institution
AMCAD Eng., Limoges, France
fYear
2010
fDate
27-28 Sept. 2010
Firstpage
134
Lastpage
137
Abstract
This paper presents a non linear model of HEMT device which operate in multi-bias conditions, that is to say in class-AB, class-B, class-C, class-D and class-S. The model was derived from pulsed I(V), pulsed S parameters and large signals measurements. The aim is to provide to the designers a single model that can be used whatever the operating class, whatever the application referred. It should be underlined that this model is able to describe third quadrant phenomena (when driving the transistor in the negative drain voltage). The target was to make this model reliable when the transistor works in class-S operating conditions. For this purpose, the model was validated on different HEMT devices and for multi-bias conditions.
Keywords
high electron mobility transistors; semiconductor device models; multi-bias conditions; negative drain voltage; nonlinear power HEMT model; pulsed S parameters; third quadrant phenomena; Gallium nitride; HEMTs; Integrated circuit modeling; Load modeling; Mathematical model; Microwave amplifiers; Solid modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Integrated Circuits Conference (EuMIC), 2010 European
Conference_Location
Paris
Print_ISBN
978-1-4244-7231-4
Type
conf
Filename
5613712
Link To Document