• DocumentCode
    530930
  • Title

    A non linear power HEMT model operating in multi-bias conditions

  • Author

    Charbonniaud, C. ; Xiong, A. ; Dellier, S. ; Jardel, O. ; Quéré, R.

  • Author_Institution
    AMCAD Eng., Limoges, France
  • fYear
    2010
  • fDate
    27-28 Sept. 2010
  • Firstpage
    134
  • Lastpage
    137
  • Abstract
    This paper presents a non linear model of HEMT device which operate in multi-bias conditions, that is to say in class-AB, class-B, class-C, class-D and class-S. The model was derived from pulsed I(V), pulsed S parameters and large signals measurements. The aim is to provide to the designers a single model that can be used whatever the operating class, whatever the application referred. It should be underlined that this model is able to describe third quadrant phenomena (when driving the transistor in the negative drain voltage). The target was to make this model reliable when the transistor works in class-S operating conditions. For this purpose, the model was validated on different HEMT devices and for multi-bias conditions.
  • Keywords
    high electron mobility transistors; semiconductor device models; multi-bias conditions; negative drain voltage; nonlinear power HEMT model; pulsed S parameters; third quadrant phenomena; Gallium nitride; HEMTs; Integrated circuit modeling; Load modeling; Mathematical model; Microwave amplifiers; Solid modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Integrated Circuits Conference (EuMIC), 2010 European
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-7231-4
  • Type

    conf

  • Filename
    5613712