Title :
Characterization of electron device breakdown under nonlinear dynamic operation
Author :
Raffo, Antonio ; Di Falco, Sergio ; Vadalà, Valeria ; Vannini, Giorgio
Author_Institution :
Dept. of Eng., Univ. of Ferrara, Ferrara, Italy
Abstract :
In this paper a new methodology to characterize the breakdown of microwave electron devices under realistic device operation is described. Different experimental examples will be provided in order to demonstrate the validity of the proposed characterization technique with respect to the ones commonly adopted.
Keywords :
microwave devices; semiconductor device breakdown; electron device breakdown; microwave electron devices; nonlinear dynamic operation; Current measurement; Electric breakdown; Logic gates; PHEMTs; Radio frequency; Voltage measurement;
Conference_Titel :
Microwave Integrated Circuits Conference (EuMIC), 2010 European
Conference_Location :
Paris
Print_ISBN :
978-1-4244-7231-4
