DocumentCode
531358
Title
Analysis of the impact of statistical variations on transmission-line based metamaterial structures
Author
Ochoa, Juan S. ; Cangellaris, Andreas C.
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
fYear
2010
fDate
28-30 Sept. 2010
Firstpage
1397
Lastpage
1400
Abstract
Localization theory is employed to investigate the impact of statistical variations in material parameters and lumped-element values on the transmission properties of transmission-line based metamaterial structures. The theory yields closed-form expressions for the calculation of the propagation constant of the disordered structure that are shown to provide an accurate alternative to the more expensive Monte Carlo approach. Application of the theory to the investigation of the transmission properties of a negative refractive index structure demonstrates its use for expedient assessment of the impact of statistical variations in unit cell length and in the values of the lumped reactive elements used in the definition of the structure.
Keywords
Monte Carlo methods; metamaterials; refractive index; transmission lines; Monte Carlo approach; localization theory; lumped-element values; metamaterial structures; negative refractive index; statistical variations; transmission line;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference (EuMC), 2010 European
Conference_Location
Paris
Print_ISBN
978-1-4244-7232-1
Type
conf
Filename
5616174
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