• DocumentCode
    531358
  • Title

    Analysis of the impact of statistical variations on transmission-line based metamaterial structures

  • Author

    Ochoa, Juan S. ; Cangellaris, Andreas C.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
  • fYear
    2010
  • fDate
    28-30 Sept. 2010
  • Firstpage
    1397
  • Lastpage
    1400
  • Abstract
    Localization theory is employed to investigate the impact of statistical variations in material parameters and lumped-element values on the transmission properties of transmission-line based metamaterial structures. The theory yields closed-form expressions for the calculation of the propagation constant of the disordered structure that are shown to provide an accurate alternative to the more expensive Monte Carlo approach. Application of the theory to the investigation of the transmission properties of a negative refractive index structure demonstrates its use for expedient assessment of the impact of statistical variations in unit cell length and in the values of the lumped reactive elements used in the definition of the structure.
  • Keywords
    Monte Carlo methods; metamaterials; refractive index; transmission lines; Monte Carlo approach; localization theory; lumped-element values; metamaterial structures; negative refractive index; statistical variations; transmission line;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference (EuMC), 2010 European
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-7232-1
  • Type

    conf

  • Filename
    5616174