• DocumentCode
    531418
  • Title

    Reconfigurable CRLH cells with new open-end stub and RF MEMS switches on silicon technology

  • Author

    Ouagague, Badreddine ; Coccetti, Fabio ; Villeneuve, Christina ; Idda, Tonio ; Plana, Robert

  • Author_Institution
    LAAS, CNRS, Toulouse, France
  • fYear
    2010
  • fDate
    28-30 Sept. 2010
  • Firstpage
    1405
  • Lastpage
    1408
  • Abstract
    Modified CRLH structures implemented on CPW technology and silicon substrate are presented. The aim of this work is to extend the structures frequency agility by adding further tuning capabilities. The classical cell composed of two series interdigital capacitors (IDC) on both sides of a stub-inductor has been modified by adding a new stub capacitor that provides a new degree of freedom by controlling the shunt capacitance CR. Moreover, the IDCs are replaced by switchable MEMS capacitors that allow a variable value of series capacitance. All cells are studied experimentally, in particular for the two actuation states of the MEMS switches, down-state and up-state. The dispersion diagrams covering all the configurations are extracted from equivalent circuit models and hereby presented. They exhibit the flexibility of the Left-Handed (LH) and Right-Handed (RH) frequencies bands. The results analyzed in the 2 - 30 GHz band show up to 15 % of frequency tunability by adding the stub capacitor and up to 150 % by changing the MEMS capacitor state. This approach proves the feasibility of flexible and reconfigurable network based on the present concept.
  • Keywords
    capacitors; coplanar waveguides; equivalent circuits; microswitches; silicon; CPW technology; IDC; MEMS capacitor; RF MEMS switches; equivalent circuit model; frequency 2 GHz to 30 GHz; interdigital capacitor; left-handed frequency band; open-end stub capacitor; reconfigurable CRLH cell; right-handed frequency band; series capacitance; shunt capacitance; silicon substrate;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference (EuMC), 2010 European
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-7232-1
  • Type

    conf

  • Filename
    5616247