• DocumentCode
    531438
  • Title

    Modeling of capacitive FSS with thick metal patches by the MoM/BI-RME method

  • Author

    Bozzi, Maurizio ; Montagna, Maria ; Perregrini, Luca

  • Author_Institution
    Dept. of Electron., Univ. of Pavia, Pavia, Italy
  • fYear
    2010
  • fDate
    28-30 Sept. 2010
  • Firstpage
    589
  • Lastpage
    592
  • Abstract
    A novel technique for the modeling of capacitive frequency selective surfaces (FSS) with thick metal patches is presented in this paper. While capacitive FSS are usually analyzed under the hypothesis of infinitely thin metal patches, taking into account the finite thickness of the metal patches is important especially in the mm- and submm-wave frequency band, where patches are electrically thick and the thin-patch approximation leads to a shift of the resonance frequency. In addition, the proposed approach permits a better evaluation of conductor losses. The MoM/BI-RME method, already applied to the modeling of capacitive FSS with infinitely thin metal patches, is extended in this paper to the efficient and accurate modeling of thick-patch FSS. A validation example is reported and compared to the results obtained with a commercial software.
  • Keywords
    frequency selective surfaces; method of moments; millimetre wave spectra; submillimetre wave spectra; BI-RME method; MoM; capacitive FSS; capacitive frequency selective surfaces; finite thickness; infinitely thin metal patches; submm-wave frequency band; thick metal patches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference (EuMC), 2010 European
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-7232-1
  • Type

    conf

  • Filename
    5616274