Homogenization of the Thin Dielectric Layers of Wound Components for the Computation of the Parasitic Capacitances in 2-D FE Electrostatics

In this paper, we propose a homogenization procedure for the thin insulation layers that surround the conductors of wounded magnetic components. The dielectrics are replaced by a homogeneous medium with an equivalent permittivity, previously computed by solving two electrostatic problems on the cell scale, using the finite element method (FEM). The homogenized model is compared with the fine one (i.e., for which each layer is finely discretized), in terms of accuracy and computational burden.