DocumentCode :
531526
Title :
Similarity-Based Bayesian Learning from Semi-structured Log Files for Fault Diagnosis of Web Services
Author :
Han, Xu ; Shi, Zhongzhi ; Niu, Wenjia ; Chen, Kunrong ; Yang, Xinghua
Author_Institution :
Key Lab. of Intell. Inf. Process., Chinese Acad. of Sci., Beijing, China
Volume :
1
fYear :
2010
fDate :
Aug. 31 2010-Sept. 3 2010
Firstpage :
589
Lastpage :
596
Abstract :
With the rapid development of XML language which has good flexibility and interoperability, more and more log files of software running information are represented in XML format, especially for Web services. Fault diagnosis by analyzing semi-structured and XML like log files is becoming an important issue in this area. For most related learning methods, there is a basic assumption that training data should be in identical structure, which does not hold in many situations in practice. In order to learn from training data in different structures, we propose a similarity-based Bayesian learning approach for fault diagnosis in this paper. Our method is to first estimate similarity degrees of structural elements from different log files. Then the basic structure of combined Bayesian network (CBN) is constructed, and the similarity-based learning algorithm is used to compute probabilities in CBN. Finally, test log data can be classified into possible fault categories based on the generated CBN. Experimental results show our approach outperforms other learning approaches on those training datasets which have different structures.
Keywords :
Web services; XML; belief networks; fault diagnosis; fault tolerant computing; learning (artificial intelligence); open systems; Web service; XML language; combined Bayesian network; fault diagnosis; semistructured log file; similarity based Bayesian learning; Bayesian learning; CBN; Web service; fault diagnosis; similarity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Web Intelligence and Intelligent Agent Technology (WI-IAT), 2010 IEEE/WIC/ACM International Conference on
Conference_Location :
Toronto, ON
Print_ISBN :
978-1-4244-8482-9
Electronic_ISBN :
978-0-7695-4191-4
Type :
conf
DOI :
10.1109/WI-IAT.2010.51
Filename :
5616413
Link To Document :
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