Multi-frequency approach to vector-network-analyzer scattering-parameter measurements

We present a multi-frequency approach to vector-network-analyzer scattering-parameter measurements. This novel approach accounts for the relationships between the measurements at different frequencies, and thus breaks with the traditional paradigm for vector-network-analyzer scattering-parameter measurements, in which the measurements are carried out independently at each frequency. We review the theoretical foundations of the multi-frequency approach, and show that it leads to a significant reduction of the measurement uncertainty and to its more complete description.