DocumentCode :
531701
Title :
Microwave resistance of metal-dielectric film nanocomposites Cox(SiO2)1−x
Author :
Rinkevich, A.B. ; Perov, D.V. ; Vaskovsky, V.O. ; Gorkovenko, A.N. ; Kuznetsov, E.A.
Author_Institution :
Inst. of Metal Phys. Ural Div., Russian Acad. of Sci., Ekaterinburg, Russia
fYear :
2010
fDate :
28-30 Sept. 2010
Firstpage :
894
Lastpage :
897
Abstract :
Penetration and reflection of millimeter waveband electromagnetic waves have been studied for thin film metal-dielectric nanocomposite Cox(SiO2)1-x materials, in which cobalt nanoparticles are placed inside of 100 nm thickness SiO2 film. Microwave properties of nanocomposite samples with different cobalt content have been measured. Measurements are carried out in frequency range from 26 to 38 GHz. The frequency dependencies of transmission and reflection coefficients are obtained. Share of power loss in the samples was calculated. The algorithm for conductivity reconstruction from the transmission coefficient frequency dependence was worked out. It was found that the microwave conductivity arises with increase of cobalt content and differs essentially from dc conductivity.
Keywords :
cobalt compounds; granular materials; high-frequency effects; microwave materials; millimetre wave materials; nanocomposites; Cox(SiO2)1-x; dc conductivity; frequency 26 GHz to 38 GHz; metal-dielectric film; microwave resistance; millimeter wave penetration; millimeter wave reflection; nanocomposite; reflection coefficient; transmission coefficient;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference (EuMC), 2010 European
Conference_Location :
Paris
Print_ISBN :
978-1-4244-7232-1
Type :
conf
Filename :
5616693
Link To Document :
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