Title :
An analysis of performance degradation of a memoryless DPD due to frequency response of an envelope amplifier in an EER Power Amplifier
Author :
Funahashi, Yuuki ; Kato, Takayuki ; Tango, Toshihiro ; Yamaoka, Atsushi ; Yamaguchi, Keiichi ; Tanabe, Yasuhiko
Author_Institution :
Corp. R&D Center, Toshiba Corp., Kawasaki, Japan
Abstract :
Dynamic supply voltage techniques, such as an EER (Envelope Elimination and Restoration) PA (Power Amplifier), have attracted significant attention recently due to their high power efficiency under back-off operation. EER PAs generally possess strong nonlinearity compared to a conventional PAs, memoryless DPD (Digital Predistortor) is therefore indispensable for maintain signal quality. However, the level of residual distortion compensation with a memoryless DPD of a two tone test is dependent on the tone spacing. In this paper, we identify that the frequency response of an envelope amplifier causes a significant degradation to the performance of a combined memoryless DPD and EER PA. A simple and useful model is proposed for the analysis of this degradation. Furthermore, we demonstrate that IMD3 (third-order intermodulation distortion) for a two tone test separation between 100 kHz and 4 MHz is improvement by up to 25dB by the memoryless DPD with a frequency response compensation envelope amplifier.
Keywords :
compensation; frequency response; intermodulation distortion; memoryless systems; power amplifiers; EER power amplifier; IMD3; back-off operation; digital predistortor; dynamic supply voltage techniques; envelope elimination and restoration; frequency response compensation envelope amplifier; high power efficiency; memoryless DPD; performance degradation; residual distortion compensation; signal quality; third-order intermodulation distortion; tone spacing;
Conference_Titel :
Microwave Conference (EuMC), 2010 European
Conference_Location :
Paris
Print_ISBN :
978-1-4244-7232-1