• DocumentCode
    531777
  • Title

    Effect of substrate on temperature range and power capacity of RF MEMS capacitive switches

  • Author

    Palego, Cristiano ; Solazzi, Francesco ; Halder, Subrata ; Hwang, James C M ; Farinelli, Paola ; Sorrentino, Roberto ; Faes, Alessandro ; Mulloni, Viviana ; Margesin, Benno

  • Author_Institution
    Lehigh Univ., Bethlehem, PA, USA
  • fYear
    2010
  • fDate
    28-30 Sept. 2010
  • Firstpage
    505
  • Lastpage
    508
  • Abstract
    A robust design of RF MEMS capacitive shunt switches was implemented with a movable gold membrane, separate and non-contacting actuation pads, and electrostatic actuation. The same design was fabricated on silicon and quartz substrates with different combinations of dielectric constant, resistivity, thermal conductivity, and thermal expansion coefficient. It was found that most switches could operate between 0°C and 60°C and handle hot switching up to at least 5.6 W. However, the pull-in voltage of the switches fabricated on quartz had stronger temperature and power dependence than that on silicon. This was attributed to greater thermal expansion mismatch, impedance mismatch and self-heating on quartz. These results show that the power-handling capacity of a switch is determined by not only its membrane design, but also its circuit environment.
  • Keywords
    impedance matching; microswitches; permittivity; quartz; radiofrequency integrated circuits; silicon; thermal conductivity; thermal expansion; RF MEMS capacitive shunt switches; actuation pad; circuit environment; dielectric constant; electrostatic actuation; hot switching; impedance mismatch; membrane design; movable gold membrane; power-handling capacity; pull-in voltage; resistivity; self-heating; substrate; temperature 0 C to 60 C; temperature range; thermal conductivity; thermal expansion coefficient; Biomembranes; Conductivity; Micromechanical devices; Radio frequency; Silicon; Substrates; Thermal conductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference (EuMC), 2010 European
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-7232-1
  • Type

    conf

  • Filename
    5617140