DocumentCode
532349
Title
Simulation and analysis of the diode characteristics based on Mulitisim and Excel
Author
Jiang, Youyong ; Ding, Mingming
Author_Institution
Dept. of Mech. & Electr. Eng., Zhejiang Water Conservancy & Hydropower Collage, Hangzhou, China
Volume
6
fYear
2010
fDate
22-24 Oct. 2010
Abstract
Multisim and Excel software is been used at the same time in the research of the diode characteristic. It has been shown while searching for on the China National Knowledge Infrastructure (CNKI) that the same research results does not appear. The Multisim software is been used to carry on simulation on the diode characteristic testing, the Excel software is been used to fit and show the volt-ampere characteristic curve and resistance characteristic curve. This way is more convenient and swifter than the traditional object electric circuit, this way is more accurate and more intuitive than the traditional hand-drawn curve. Through the study on simulation data and fitting curve, the understanding of the diode characteristic is been strengthened.
Keywords
circuit analysis computing; semiconductor device testing; semiconductor diodes; China national knowledge infrastructure; Excel software; Multisim software; diode characteristic simulation; diode characteristic testing; fitting curve; hand-drawn curve; object electric circuit; resistance characteristic curve; simulation data; volt-ampere characteristic curve; Analytical models; Potentiometers; RNA; Resistance; Excel; Multisim; fitting curve; originality; test simulation;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Application and System Modeling (ICCASM), 2010 International Conference on
Conference_Location
Taiyuan
Print_ISBN
978-1-4244-7235-2
Electronic_ISBN
978-1-4244-7237-6
Type
conf
DOI
10.1109/ICCASM.2010.5620380
Filename
5620380
Link To Document