• DocumentCode
    532349
  • Title

    Simulation and analysis of the diode characteristics based on Mulitisim and Excel

  • Author

    Jiang, Youyong ; Ding, Mingming

  • Author_Institution
    Dept. of Mech. & Electr. Eng., Zhejiang Water Conservancy & Hydropower Collage, Hangzhou, China
  • Volume
    6
  • fYear
    2010
  • fDate
    22-24 Oct. 2010
  • Abstract
    Multisim and Excel software is been used at the same time in the research of the diode characteristic. It has been shown while searching for on the China National Knowledge Infrastructure (CNKI) that the same research results does not appear. The Multisim software is been used to carry on simulation on the diode characteristic testing, the Excel software is been used to fit and show the volt-ampere characteristic curve and resistance characteristic curve. This way is more convenient and swifter than the traditional object electric circuit, this way is more accurate and more intuitive than the traditional hand-drawn curve. Through the study on simulation data and fitting curve, the understanding of the diode characteristic is been strengthened.
  • Keywords
    circuit analysis computing; semiconductor device testing; semiconductor diodes; China national knowledge infrastructure; Excel software; Multisim software; diode characteristic simulation; diode characteristic testing; fitting curve; hand-drawn curve; object electric circuit; resistance characteristic curve; simulation data; volt-ampere characteristic curve; Analytical models; Potentiometers; RNA; Resistance; Excel; Multisim; fitting curve; originality; test simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Application and System Modeling (ICCASM), 2010 International Conference on
  • Conference_Location
    Taiyuan
  • Print_ISBN
    978-1-4244-7235-2
  • Electronic_ISBN
    978-1-4244-7237-6
  • Type

    conf

  • DOI
    10.1109/ICCASM.2010.5620380
  • Filename
    5620380