Title :
A design of attitude indicator based on mems technology
Author :
Li, Wen-Qiang ; Ma, Fu-Chang ; Zhang, Ying-Mei ; Lu, Yang
Author_Institution :
North Univ. of China, Taiyuan, China
Abstract :
This paper introduces a new design of attitude indicator based on MEMS technology. It analyzes the principle of testing attitude by acceleration sensor, the conditioning circuit, calculation and scale transform. It also gives a method which can realize by MMA7260 to measure the biaxial acceleration signal. Using inner ADC of ATmega16, collecting and converting conditioned signals, as well as the precision of the system improved from 10 bits to 14 bits based on the technique of oversampling. The experimental results show that the attitude indicator has the measuring range of dual spindle: ±90°, precision: ±1°, meets design requirements.
Keywords :
analogue-digital conversion; attitude measurement; microsensors; signal sampling; MEMS technology; MMA7260; acceleration sensor; attitude indicator; attitude testing; biaxial acceleration signal; conditioned signal conversion; conditioning circuit; inner ADC; Acceleration; Gravity; Maintenance engineering; Mechanical variables measurement; Micromechanical devices; Navigation; AVR; MEMS acceleration sensor; MMA7260; attitude indicator; oversampling;
Conference_Titel :
Computer Application and System Modeling (ICCASM), 2010 International Conference on
Conference_Location :
Taiyuan
Print_ISBN :
978-1-4244-7235-2
Electronic_ISBN :
978-1-4244-7237-6
DOI :
10.1109/ICCASM.2010.5620831
