• DocumentCode
    532631
  • Title

    Characterization and control of femtosecond localized plasmon using spectral interferometry with SNOM or fringe-resolved autocorrelation with dark-field microscopy

  • Author

    Kannari, Fumihiko ; Matsuishi, Keiichiro ; Harada, Takuya ; Ohi, Jun ; Oishi, Yu

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Keio Univ., Yokohama, Japan
  • fYear
    2010
  • fDate
    19-23 Sept. 2010
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    We apply two nova methods, a spectral interferometry with NSOM, and fringe-resolved-autocorrelation with dark-field microscopy in the spatio-temporal characterization of femtosecond localized plasmon at metal nanostructures. Spatio-temporal plasmon control is studied using these diagnostics.
  • Keywords
    high-speed optical techniques; light interferometry; nanostructured materials; near-field scanning optical microscopy; optical microscopy; plasmonics; spatiotemporal phenomena; SNOM; dark-field microscopy; femtosecond localized plasmon; fringe-resolved autocorrelation; spatio-temporal plasmon control; spectral interferometry; Decision support systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Optical Communication (ECOC), 2010 36th European Conference and Exhibition on
  • Conference_Location
    Torino
  • Print_ISBN
    978-1-4244-8536-9
  • Electronic_ISBN
    978-1-4244-8534-5
  • Type

    conf

  • DOI
    10.1109/ECOC.2010.5621113
  • Filename
    5621113
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=532631