DocumentCode :
532644
Title :
Shock wave pressure testing two-channel storage
Author :
Zhang, Jian-Xin ; Zhang, He ; Zhou, Xing
Author_Institution :
Ministerial Key Lab. of ZNDY, Nanjing Univ. of Sci. & Tech., Nanjing, China
Volume :
14
fYear :
2010
fDate :
22-24 Oct. 2010
Abstract :
According to the problem of low stable system, not high test circuit integration, unitary measured data,and data easy to lose in testing overpressure signal during the explosion,methods of stored testing and measuring by using Internal and external control trigger modeare presented. In this method, the explosion signal is collected and memoried by two channels at the same time. The first channel to capture the signal changes in the value of trigger signals, and the data stored in memory channel 1; the second channel used the explosion of ammunition as external interrupt to control signal collecting,and the data stored in memory channel 2. Analysis and tests show that the combination of two memory testing methods is able to maximize the impact of reduced external interference signals; the data is stored in nonvolatile memory during the data collection process and kept real time, which can effectively improve the reliability of a single test and maximize the system availability.
Keywords :
circuit reliability; circuit testing; random-access storage; shock waves; data collection process; data easy; explosion signal; external control trigger mode; interference signal; memory channel; memory testing method; nonvolatile memory; overpressure signal; reliability; shock wave pressure testing; stable system; system availability; test circuit integration; trigger signal; two-channel storage; unitary measured data; Control systems; Electronic mail; Energy measurement; Measurement uncertainty; Process control; Semiconductor device measurement; Reliability; Shock wave; Stored testing and measuring; Two-channel;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Application and System Modeling (ICCASM), 2010 International Conference on
Conference_Location :
Taiyuan
Print_ISBN :
978-1-4244-7235-2
Electronic_ISBN :
978-1-4244-7237-6
Type :
conf
DOI :
10.1109/ICCASM.2010.5622115
Filename :
5622115
Link To Document :
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