DocumentCode
532902
Title
Topographic correction method of remote sensing image considering Bi-directional reflectance
Author
Han, Xiaomeng ; Li, Xianhua ; Zhu, Ruifang ; Shi, Xiangyong
Author_Institution
Res. Center of Remote Sensing & Spatial, Inf. Sci., Shanghai Univ., Shanghai, China
Volume
15
fYear
2010
fDate
22-24 Oct. 2010
Abstract
Traditional topographic correctional methods do not take fully account of the bumpiness and texture of the surface. In this paper, a topographic correction approach is proposed based on the surface roughness model. The model presents non-Lambert´s characteristics of the terrain surface better than others, because it assumed the surface is composed of V-cavities. The V-cavities facets were partially illuminated or visible as the adjacent facet casts a shadow on it or occludes it. Additionally, the geometric attenuation factor (GAF) is used for improving accuracy, which equals the ratio of the facet area that is both visible and illuminated to the total facet area. Meanwhile, Bi-directional topographic correction is deliberated based on the hypothesis of V-cavities. The advantage of the proposed model is tested through a topographic correction case on remote sensing image.
Keywords
geophysical image processing; radiometry; reflectivity; remote sensing; surface roughness; topography (Earth); V- cavity; bidirectional reflectance; geometric attenuation factor; nonLambert characteristics; remote sensing image; surface roughness model; surface texture; terrain surface; topographic correction method; Medical services; Bi-directional Reflectance; Radiometric Correction; Surface Roughness; the Geometric Attenuation Factor (GAF);
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Application and System Modeling (ICCASM), 2010 International Conference on
Conference_Location
Taiyuan
Print_ISBN
978-1-4244-7235-2
Electronic_ISBN
978-1-4244-7237-6
Type
conf
DOI
10.1109/ICCASM.2010.5622511
Filename
5622511
Link To Document