DocumentCode :
532902
Title :
Topographic correction method of remote sensing image considering Bi-directional reflectance
Author :
Han, Xiaomeng ; Li, Xianhua ; Zhu, Ruifang ; Shi, Xiangyong
Author_Institution :
Res. Center of Remote Sensing & Spatial, Inf. Sci., Shanghai Univ., Shanghai, China
Volume :
15
fYear :
2010
fDate :
22-24 Oct. 2010
Abstract :
Traditional topographic correctional methods do not take fully account of the bumpiness and texture of the surface. In this paper, a topographic correction approach is proposed based on the surface roughness model. The model presents non-Lambert´s characteristics of the terrain surface better than others, because it assumed the surface is composed of V-cavities. The V-cavities facets were partially illuminated or visible as the adjacent facet casts a shadow on it or occludes it. Additionally, the geometric attenuation factor (GAF) is used for improving accuracy, which equals the ratio of the facet area that is both visible and illuminated to the total facet area. Meanwhile, Bi-directional topographic correction is deliberated based on the hypothesis of V-cavities. The advantage of the proposed model is tested through a topographic correction case on remote sensing image.
Keywords :
geophysical image processing; radiometry; reflectivity; remote sensing; surface roughness; topography (Earth); V- cavity; bidirectional reflectance; geometric attenuation factor; nonLambert characteristics; remote sensing image; surface roughness model; surface texture; terrain surface; topographic correction method; Medical services; Bi-directional Reflectance; Radiometric Correction; Surface Roughness; the Geometric Attenuation Factor (GAF);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Application and System Modeling (ICCASM), 2010 International Conference on
Conference_Location :
Taiyuan
Print_ISBN :
978-1-4244-7235-2
Electronic_ISBN :
978-1-4244-7237-6
Type :
conf
DOI :
10.1109/ICCASM.2010.5622511
Filename :
5622511
Link To Document :
بازگشت