Title :
Triggering of transient latch-up (TLU) by system level ESD
Author :
Brodbeck, Tilo ; Stadler, Wolfgang ; Baumann, Christian ; Esmark, Kai ; Domanski, Krzysztof
Author_Institution :
ETS DIR SVQ, Infineon Technol. AG, Munich, Germany
Abstract :
This paper investigates the influences of the temperature and the trigger parameters (width and rise time) on the threshold of transient latch-up (TLU). It is shown that temperature is a much more critical parameter than transient trigger parameters. For high discharge currents which are typical for system level surges as e.g. cable discharge events, even very short trigger pulses can cause TLU.
Keywords :
CMOS integrated circuits; electrostatic discharge; integrated circuit testing; IC latch-up test; cable discharge events; discharge currents; system level ESD; transient latch-up; transient trigger parameters; Clamps; Electrostatic discharge; Generators; Power supplies; Stress; Thyristors; Transient analysis;
Conference_Titel :
Electrical Overstress/ Electrostatic Discharge Symposium (EOS/ESD), 2010 32nd
Conference_Location :
Reno, NV
Print_ISBN :
978-1-58537-182-2
Electronic_ISBN :
978-1-58537-182-2
