• DocumentCode
    533349
  • Title

    An ESD design automation framework and tool flow for nano-scale CMOS technologies

  • Author

    Muhammad, Mujahid ; Gauthier, Robert ; Li, Junjun ; Ginawi, Ahmed ; Montstream, James ; Mitra, Souvick ; Chatty, Kiran ; Joshi, Amol ; Henderson, Karen ; Palmer, Nicholas ; Hulse, Brian

  • Author_Institution
    IBM, Essex Junction, VT, USA
  • fYear
    2010
  • fDate
    3-8 Oct. 2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    We present a successfully implemented ESD design automation framework that evaluates and verifies the ESD protection methodology at all stages of a standard integrated circuit design flow. The tools used at each step of the flow and sample results showing excellent correlation to hardware test data is presented.
  • Keywords
    CMOS integrated circuits; electrostatic discharge; ESD design automation framework; ESD protection methodology; nanoscale CMOS technologies; standard integrated circuit design flow; tool flow; Clamps; Discharges; Electrostatic discharge; Integrated circuit modeling; Integrated circuit synthesis; Layout; Resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/ Electrostatic Discharge Symposium (EOS/ESD), 2010 32nd
  • Conference_Location
    Reno, NV
  • Print_ISBN
    978-1-58537-182-2
  • Electronic_ISBN
    978-1-58537-182-2
  • Type

    conf

  • Filename
    5623716
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=533349