• DocumentCode
    533373
  • Title

    Study of power arrays in ESD operation regimes

  • Author

    Aliaj, Blerina ; Vashchenko, Vladislav ; Lindorfer, Philipp ; Tcherniaev, Andrew ; Ershov, Maxim ; Liou, Juin J. ; Hopper, Peter

  • Author_Institution
    Sch. of Electr. Eng. & Comput. Sci., Univ. of Central Florida, Orlando, FL, USA
  • fYear
    2010
  • fDate
    3-8 Oct. 2010
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    The self-protection capability of arrays as a layout dependent parameter have been studied using a novel 2.5D simulation methodology. Several topology elements are identified to improve HBM robustness of the arrays. The physical effects responsible for local burnout are demonstrated based upon simulation tool capability.
  • Keywords
    electrostatic discharge; 2.5D simulation methodology; ESD operation regimes; HBM robustness; layout dependent parameter; physical effects; power arrays; self-protection array capability; Current distribution; Electrostatic discharge; Layout; Logic gates; Metals; Resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/ Electrostatic Discharge Symposium (EOS/ESD), 2010 32nd
  • Conference_Location
    Reno, NV
  • Print_ISBN
    978-1-58537-182-2
  • Electronic_ISBN
    978-1-58537-182-2
  • Type

    conf

  • Filename
    5623743
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=533373