Title :
Impact of difference between discharging methods on CDM testing
Author :
Morishita, Yasuyuki ; Ishizuka, Hiroyasu ; Hiraoka, Takayuki ; Hashimoto, Kenji ; Wakai, Nobuyuki ; Kumashiro, Shigetaka ; Mogami, Thoru
Author_Institution :
NEC Sagamihara Plant, MIRAI-Selete, Sagamihara, Japan
Abstract :
We present significant difference between the relay and air discharging methods in CDM testing. The relay discharging method can give inaccurate CDM threshold levels in IC device qualification, which is due to parasitic elements within the relay. It is shown that the air discharging is a better testing method to emulate CDM event under natural discharging condition although it has disadvantage in repeatability.
Keywords :
discharges (electric); integrated circuit testing; CDM testing; CDM threshold levels; IC device qualification; air discharging methods; parasitic elements; relay discharging method; Current measurement; Discharges; Electrostatic discharge; Films; Logic gates; Relays; Testing;
Conference_Titel :
Electrical Overstress/ Electrostatic Discharge Symposium (EOS/ESD), 2010 32nd
Conference_Location :
Reno, NV
Print_ISBN :
978-1-58537-182-2
Electronic_ISBN :
978-1-58537-182-2
