Title :
Express analysis of MMIC limiters reliability based on numerical modeling of thermal processes
Author :
Vorobiyov, A.A. ; Krutov, A.V. ; Rebrov, A.S.
Author_Institution :
FSUE RPC Istok, Fryazino, Russia
Abstract :
In the present article an express analysis of mmic limiters reliability based on numerical modeling of thermal processes are presented. The simulated results of diode maximum junction temperature versus power dissipation are shown. Experimental MTTF determination of the test diode is made.
Keywords :
MMIC; integrated circuit reliability; integrated circuit testing; microwave diodes; microwave limiters; numerical analysis; MMIC limiter reliability; diode maximum junction temperature; numerical modeling; power dissipation; thermal processes; Analytical models; Junctions; MMICs; Numerical models; Power dissipation; Semiconductor device reliability;
Conference_Titel :
Microwave and Telecommunication Technology (CriMiCo), 2010 20th International Crimean Conference
Conference_Location :
Sevastopol
Print_ISBN :
978-1-4244-7184-3
DOI :
10.1109/CRMICO.2010.5632524
