Title :
Study of scanning microwave tomography of subsurface targets
Author :
Gaikovich, K.P. ; Gaikovich, P.K. ; Maksimovitch, Ye.S. ; Badeev, V.A.
Author_Institution :
Inst. for Phys. of Microstructures, RAS, Nizhny Novgorod, Russia
Abstract :
Results of numerical simulation of the scanning microwave tomography of dielectric objects based on the inverse scattering problem solution by 2D data of multi-frequency near-surface microwave measurements are presented. Modeling has been carried out both for continuously distributed inhomogeneities of the complex permittivity and for homogeneous rectangular objects. Results demonstrate the reliability of the algorithm of the inverse problem solution and make it possible to determine the achievable accuracy and quality of the considered tomography with the available equipment.
Keywords :
microwave measurement; permittivity; tomography; complex permittivity; dielectric objects; inverse scattering; near surface microwave measurements; scanning microwave tomography; Electronic mail; Microwave FET integrated circuits; Microwave antennas; Microwave integrated circuits; Microwave theory and techniques; Nonhomogeneous media; Tomography;
Conference_Titel :
Microwave and Telecommunication Technology (CriMiCo), 2010 20th International Crimean Conference
Conference_Location :
Sevastopol
Print_ISBN :
978-1-4244-7184-3
DOI :
10.1109/CRMICO.2010.5632995
