DocumentCode :
53413
Title :
Reliability of Self-Assembly Vertical Interconnects in Magnetically Aligned Anisotropic Conductive Adhesive for Electronic Packaging Applications
Author :
Sungwook Moon
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Volume :
13
Issue :
3
fYear :
2013
fDate :
Sept. 2013
Firstpage :
413
Lastpage :
419
Abstract :
A self-assembly process in a magnetically aligned anisotropic conductive adhesive (MA-ACA) is a novel approach to selectively create high-density vertical interconnects by magnetic interaction between ferromagnetic input-output pads and particles. In order to characterize self-assembly vertical interconnects created in an MA-ACA, quad-flat no-lead chips with 40 daisy chain pads were assembled on a printed circuit board. In reliability tests, the dc resistance of self-assembly test samples was observed to be 35.9% and -12.1% changed at temperatures of 85°C and -55°C, respectively, after 700 thermal shock cycles and 0.4% changed after an 8-h vibration test. In contrast, the dc resistance was observed to be significantly 41.4 Ω increased due to humidity absorption after an 85°C temperature-85% humidity test for 500 h. Thus, in order to prevent humidity percolation in the self-assembly vertical interconnects, a Parylene-C material was used as a barrier layer. The dc resistance change of Parylene-deposited test samples with a thickness of 10 μm was observed to be greatly 85.2% reduced after an 85°C temperature-85% humidity test. In addition, based on a Weibull distribution model, the mean time to failure of self-assembly vertical interconnects was estimated to be importantly 94.7% improved. Consequently, the proposed self-assembly packaging using a Parylene material is applicable to cost-effective electronic applications.
Keywords :
Weibull distribution; absorption; circuit reliability; conductive adhesives; dynamic testing; electronics packaging; printed circuits; self-assembly; thermal shock; DC resistance; MA-ACA; Parylene material; Parylene-C material; Weibull distribution model; barrier layer; electronic packaging application; ferromagnetic input-output pad-particle; high-density vertical interconnects; humidity absorption; humidity percolation; humidity test; magnetic interaction; magnetically-aligned anisotropic conductive adhesive; mean time-to-failure; printed circuit board; quad-flat no-lead chips; reliability test; resistance 41.4 ohm; self-assembly packaging; self-assembly process; self-assembly test samples; self-assembly vertical interconnect reliability; size 10 mum; temperature -55 degC; temperature 85 degC; thermal shock cycles; time 500 h; time 8 h; vibration test; Humidity; Materials; Packaging; Reliability; Resistance; Self-assembly; Vibrations; Anisotropic conductive adhesive (ACA); magnetic interaction; packaging; reliability; self-assembly process;
fLanguage :
English
Journal_Title :
Device and Materials Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
1530-4388
Type :
jour
DOI :
10.1109/TDMR.2013.2246566
Filename :
6461079
Link To Document :
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