• DocumentCode
    534312
  • Title

    Electro-thermal co-simulation of ICs with runtime back-annotation capability

  • Author

    Timár, András ; Bognár, György ; Poppe, András ; Rencz, Márta

  • Author_Institution
    Dept. of Electron Devices, Budapest Univ. of Technol. & Econ., Budapest, Hungary
  • fYear
    2010
  • fDate
    6-8 Oct. 2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper presents a novel approach to logical and thermal co-simulation of ASIC circuits. Numerous electrothermal simulator implementations are present nowadays, but these simulators approach the electro-thermal simulation domain by co-simulating electronic and thermal effects at a low structural level. This approach has the advantage of being very accurate but at the expense of simulation time. In this paper we provide an alternative way to simulate standard cell ASIC circuits electrically and thermally in a concurrent process in real-time, in RTL level. Our approach takes standard cells of the digital design as basic building blocks and calculates a thermal distribution map on the surface of the virtual chip. The temperature map is calculated from the cells´ power characteristics and the switching activity of the regularly working circuit. We call the presented approach logi-thermal simulation. An implementation of the method is also presented in this paper: a new simulation software, LogiTherm is under heavy development in the Department of Electron Devices at BME, Hungary.
  • Keywords
    application specific integrated circuits; integrated circuit modelling; logic design; thermal analysis; thermal management (packaging); ASIC circuits; LogiTherm; RTL level; electrothermal cosimulation; logical-thermal cosimulation; runtime back annotation capability; thermal distribution map; virtual chip; Biological system modeling; Databases; Delay; Integrated circuit modeling; Logic gates; Switches; electro-thermal simulation; logi-thermal simulation; temperature distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal Investigations of ICs and Systems (THERMINIC), 2010 16th International Workshop on
  • Conference_Location
    Barcelona
  • Print_ISBN
    978-1-4244-8453-9
  • Type

    conf

  • Filename
    5636309