• DocumentCode
    534322
  • Title

    Re-design and validation of the ‘STATIM’ TIM tester

  • Author

    Székely, V. ; Vass-Várnai, A. ; Kollár, E.

  • Author_Institution
    Dept. of Electron Devices, Budapest Univ. of Technol. & Econ., Budapest, Hungary
  • fYear
    2010
  • fDate
    6-8 Oct. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper the improvement of the original version of the `STATIM´ tester, designed for the high precision measurement of cutting-edge TIM materials is explained. Although the first design has validated the concept of the tester, the first hand-on experiences have set further requirements for a possible new design. The measurement of thermally conductive greases requires the precise setting of the bond line thickness, in a fine resolution. As the sensor chips are directly exposed to the samples to be measured, there is a change that they get damaged during the lifetime of the tester. In the following paragraphs the solutions for these problems are explained and measurement results are shown using the redesigned equipment.
  • Keywords
    phase change materials; thermal conductivity; thermal management (packaging); STATIM tester; thermal interface materials; Calibration; Heating; Materials; Semiconductor device measurement; Temperature measurement; Temperature sensors; Thermal conductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal Investigations of ICs and Systems (THERMINIC), 2010 16th International Workshop on
  • Conference_Location
    Barcelona
  • Print_ISBN
    978-1-4244-8453-9
  • Type

    conf

  • Filename
    5636327