DocumentCode
534440
Title
Simulation study of neural damage induced by different stimulus waveforms
Author
Sun, Chen ; Zhang, Xu ; Ren, Zhaohui ; Dong, Qian ; Cui, Nan
Author_Institution
Sch. of Biomed. Eng., Capital Med. Univ., Beijing, China
Volume
3
fYear
2010
fDate
16-18 Oct. 2010
Firstpage
1256
Lastpage
1259
Abstract
Based on the McNeal cable model, taking the myelinated nerve fiber with limited length as the research object, the aim of this paper is to simulate nerve conduction block induced by functional electrical stimulation (FES) and then investigate the block regularity, we also compared the degree of neural damage induced by high frequency symmetry biphasic pulses and intermittent biphasic pulses. In our simulation, we selected the axon whose diameter was 10μm, the test current intensity was 0.5mA and the temperature was 37°C. The results showed that under each frequency (6KHz, 7KHz, 8KHz, 9KHz, 10KHz, 15KHz), the two waveforms´ stimulus intensity needed to block the propagation of action potential were similar. In the case that every other condition was the same, symmetric biphasic pulses caused a greater neural damage than intermittent biphasic pulses. This simulation study could provide more information for animal experiments as well as clinical applications of electrical nerve block.
Keywords
bioelectric potentials; neuromuscular stimulation; physiological models; McNeal cable model; action potential propagation; axon; current 0.5 mA; frequency 6 kHz to 15 kHz; functional electrical stimulation; high frequency symmetry biphasic pulses; intermittent biphasic pulses; myelinated nerve fiber; nerve conduction; neural damage; size 10 mum; stimulus waveforms; temperature 37 degC; Analytical models; Animals; Biological system modeling; Biomembranes; Electric potential; Electrodes; Nerve fibers; intermittent biphasic pulses; nerve conduction block; neural damage; symmetry biphasic pulses;
fLanguage
English
Publisher
ieee
Conference_Titel
Biomedical Engineering and Informatics (BMEI), 2010 3rd International Conference on
Conference_Location
Yantai
Print_ISBN
978-1-4244-6495-1
Type
conf
DOI
10.1109/BMEI.2010.5639274
Filename
5639274
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