Title :
An unsupervised phenotypes and informative genes detection model with outlier consideration
Author :
Li, Yuan ; Zhao, Yuhai ; Wang, Guoren ; Wang, Zhanghui
Author_Institution :
Coll. of Inf. Sci. & Eng., Northeastern Univ., NEU, Shenyang, China
Abstract :
The DNA microarray technology enables rapid, large scale screening for patterns of gene expression. It is meaningful to detect useful phenotypes and the informative genes that can manifest these phenotypes in gene expression data. While the existing methods of phenotypes discriminating are most supervised methods, they train samples based on the known informative genes. In this paper, we propose an unsupervised phenotypes and informative genes detection model with outlier consideration called UPID, which can simultaneously mining phenotypes and informative genes from gene expression data. By adopting incremental computing optimization strategies, the calculation of UPID is greatly reduced. Furthermore, UPID decreases the impact of outliers by taking the sample proportion of each group into consideration, which makes the model more robust. Compared with HS, a previous pattern detection method for gene expression data, it shows that the algorithm we proposed, UPID is more efficient. Moreover, the experiments conducted on several real microarray datasets prove the effectiveness of the UPID algorithm.
Keywords :
DNA; bioinformatics; data mining; genetics; molecular biophysics; molecular configurations; optimisation; DNA microarray technology; UPID algorithm; gene expression data; gene expression patterns; incremental computing optimization strategies; informative gene mining; outlier consideration; phenotype discrimination; phenotype mining; unsupervised informative gene detection model; unsupervised phenotype model; Algorithm design and analysis; Data mining; Gene expression; Heuristic algorithms; Noise; Optimization; Partitioning algorithms; Bioinformatics; Data mining; Informative genes; Microarray; Phenotype; gene expression data;
Conference_Titel :
Biomedical Engineering and Informatics (BMEI), 2010 3rd International Conference on
Conference_Location :
Yantai
Print_ISBN :
978-1-4244-6495-1
DOI :
10.1109/BMEI.2010.5639328