Title :
A new processing method for the end effect problem of empirical mode decomposition
Author :
Quan, Haiyan ; Liu, Zengli ; Shi, Xinling
Author_Institution :
Fac. of Inf. & Autom., Kunming Univ. of Sci. & Technol., Kunming, China
Abstract :
In the empirical mode decomposition (EMD) method, the problem of end effect exists. By the mirror extending approach, the uniformity of the sifting process of EMD is implemented, but the problem of end pollution still exists. In the paper, an adaptive sifting approach is proposed. In the approach, the end extrema are determined by data itself, so, the Envelopes of data are calculated more reasonably. The approach not only implements the uniform of the sifting process of EMD, but also eliminates the end pollution, so that EMD method can be used more effectively.
Keywords :
signal processing; EMD sifting process; empirical mode decomposition method; end effect problem; end extrema; mirror extending approach; signal decomposition method; signal envelope; Buildings; Distortion; Joints; Mirrors; Pollution; Signal analysis; Spline; EMD; end effection; mirror extending; signal envelope;
Conference_Titel :
Image and Signal Processing (CISP), 2010 3rd International Congress on
Conference_Location :
Yantai
Print_ISBN :
978-1-4244-6513-2
DOI :
10.1109/CISP.2010.5647347