DocumentCode
535218
Title
A new processing method for the end effect problem of empirical mode decomposition
Author
Quan, Haiyan ; Liu, Zengli ; Shi, Xinling
Author_Institution
Fac. of Inf. & Autom., Kunming Univ. of Sci. & Technol., Kunming, China
Volume
7
fYear
2010
fDate
16-18 Oct. 2010
Firstpage
3391
Lastpage
3394
Abstract
In the empirical mode decomposition (EMD) method, the problem of end effect exists. By the mirror extending approach, the uniformity of the sifting process of EMD is implemented, but the problem of end pollution still exists. In the paper, an adaptive sifting approach is proposed. In the approach, the end extrema are determined by data itself, so, the Envelopes of data are calculated more reasonably. The approach not only implements the uniform of the sifting process of EMD, but also eliminates the end pollution, so that EMD method can be used more effectively.
Keywords
signal processing; EMD sifting process; empirical mode decomposition method; end effect problem; end extrema; mirror extending approach; signal decomposition method; signal envelope; Buildings; Distortion; Joints; Mirrors; Pollution; Signal analysis; Spline; EMD; end effection; mirror extending; signal envelope;
fLanguage
English
Publisher
ieee
Conference_Titel
Image and Signal Processing (CISP), 2010 3rd International Congress on
Conference_Location
Yantai
Print_ISBN
978-1-4244-6513-2
Type
conf
DOI
10.1109/CISP.2010.5647347
Filename
5647347
Link To Document