• DocumentCode
    535218
  • Title

    A new processing method for the end effect problem of empirical mode decomposition

  • Author

    Quan, Haiyan ; Liu, Zengli ; Shi, Xinling

  • Author_Institution
    Fac. of Inf. & Autom., Kunming Univ. of Sci. & Technol., Kunming, China
  • Volume
    7
  • fYear
    2010
  • fDate
    16-18 Oct. 2010
  • Firstpage
    3391
  • Lastpage
    3394
  • Abstract
    In the empirical mode decomposition (EMD) method, the problem of end effect exists. By the mirror extending approach, the uniformity of the sifting process of EMD is implemented, but the problem of end pollution still exists. In the paper, an adaptive sifting approach is proposed. In the approach, the end extrema are determined by data itself, so, the Envelopes of data are calculated more reasonably. The approach not only implements the uniform of the sifting process of EMD, but also eliminates the end pollution, so that EMD method can be used more effectively.
  • Keywords
    signal processing; EMD sifting process; empirical mode decomposition method; end effect problem; end extrema; mirror extending approach; signal decomposition method; signal envelope; Buildings; Distortion; Joints; Mirrors; Pollution; Signal analysis; Spline; EMD; end effection; mirror extending; signal envelope;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image and Signal Processing (CISP), 2010 3rd International Congress on
  • Conference_Location
    Yantai
  • Print_ISBN
    978-1-4244-6513-2
  • Type

    conf

  • DOI
    10.1109/CISP.2010.5647347
  • Filename
    5647347