• DocumentCode
    537004
  • Title

    Fault Propagation Characteristics and Reliability Analysis of Large-Scale Circuit

  • Author

    Tan, Hu ; Peng, Minfang ; Wang, Jiajia

  • Author_Institution
    Coll. of Electr. & Inf. Eng., Hunan Univ., Changsha, China
  • fYear
    2010
  • fDate
    7-9 Nov. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper deals with the fault propagation and reliability of large-scale circuit and attempts to provide effective information for fault diagnosing. We analyse sample circuits from IBM benchmark suit by constructing directional weighting networks and modeling fault propagation. Roles of circuit network parameters are investigated and reliability analysis is given. The result from this work clearly suggest that larger circuit is more likely to arouse deep propagation, and there is no good in pursuit of maximum streamline in circuit design.
  • Keywords
    circuit reliability; fault diagnosis; logic design; IBM benchmark suit; circuit design; directional weighting networks; fault diagnosing; fault propagation; large-scale circuit; reliability analysis; Benchmark testing; Circuit faults; Complex networks; Integrated circuit modeling; Integrated circuit reliability; Reliability engineering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    E-Product E-Service and E-Entertainment (ICEEE), 2010 International Conference on
  • Conference_Location
    Henan
  • Print_ISBN
    978-1-4244-7159-1
  • Type

    conf

  • DOI
    10.1109/ICEEE.2010.5660862
  • Filename
    5660862