Title :
Fault Propagation Characteristics and Reliability Analysis of Large-Scale Circuit
Author :
Tan, Hu ; Peng, Minfang ; Wang, Jiajia
Author_Institution :
Coll. of Electr. & Inf. Eng., Hunan Univ., Changsha, China
Abstract :
This paper deals with the fault propagation and reliability of large-scale circuit and attempts to provide effective information for fault diagnosing. We analyse sample circuits from IBM benchmark suit by constructing directional weighting networks and modeling fault propagation. Roles of circuit network parameters are investigated and reliability analysis is given. The result from this work clearly suggest that larger circuit is more likely to arouse deep propagation, and there is no good in pursuit of maximum streamline in circuit design.
Keywords :
circuit reliability; fault diagnosis; logic design; IBM benchmark suit; circuit design; directional weighting networks; fault diagnosing; fault propagation; large-scale circuit; reliability analysis; Benchmark testing; Circuit faults; Complex networks; Integrated circuit modeling; Integrated circuit reliability; Reliability engineering;
Conference_Titel :
E-Product E-Service and E-Entertainment (ICEEE), 2010 International Conference on
Conference_Location :
Henan
Print_ISBN :
978-1-4244-7159-1
DOI :
10.1109/ICEEE.2010.5660862