DocumentCode
537004
Title
Fault Propagation Characteristics and Reliability Analysis of Large-Scale Circuit
Author
Tan, Hu ; Peng, Minfang ; Wang, Jiajia
Author_Institution
Coll. of Electr. & Inf. Eng., Hunan Univ., Changsha, China
fYear
2010
fDate
7-9 Nov. 2010
Firstpage
1
Lastpage
4
Abstract
This paper deals with the fault propagation and reliability of large-scale circuit and attempts to provide effective information for fault diagnosing. We analyse sample circuits from IBM benchmark suit by constructing directional weighting networks and modeling fault propagation. Roles of circuit network parameters are investigated and reliability analysis is given. The result from this work clearly suggest that larger circuit is more likely to arouse deep propagation, and there is no good in pursuit of maximum streamline in circuit design.
Keywords
circuit reliability; fault diagnosis; logic design; IBM benchmark suit; circuit design; directional weighting networks; fault diagnosing; fault propagation; large-scale circuit; reliability analysis; Benchmark testing; Circuit faults; Complex networks; Integrated circuit modeling; Integrated circuit reliability; Reliability engineering;
fLanguage
English
Publisher
ieee
Conference_Titel
E-Product E-Service and E-Entertainment (ICEEE), 2010 International Conference on
Conference_Location
Henan
Print_ISBN
978-1-4244-7159-1
Type
conf
DOI
10.1109/ICEEE.2010.5660862
Filename
5660862
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