DocumentCode :
537272
Title :
Complex Electronic System Performance Degradation Prediction Using Incomplete Measurement Data
Author :
He Ying ; Chen Jian
Author_Institution :
Dept. of reliability, Electron. Equip. Inst. of north China, Beijing, China
fYear :
2010
fDate :
7-9 Nov. 2010
Firstpage :
1
Lastpage :
4
Abstract :
A performance degradation prediction method for multi-unit system with insufficient measurement data is proposed by integrating data recovering model, hidden Markov model and support vector regression (SVR) model. The development of the model includes three main parts. Part one, a principal component analysis (PCA) model is build based on normal state. Part two, a hidden Markov model(HMM) is trained based on principal data and log-likelihood ratios that the normal state´s HMM give to the life-cycle historical degradation sequence are calculated to evaluate system degradation. Part three, a SVR model is adopted for modeling degradation process. So, when a new sample with missing data comes, following steps will be taken: recover the principal component based on PCA model, calculate the log-likelihood of degradation sequence based on normal HMM, and then predict future degradation with SVR model. A numerical simulation is taken as an example to show the feasibility and validity of the proposed method.
Keywords :
electrical maintenance; failure analysis; fault location; hidden Markov models; numerical analysis; principal component analysis; regression analysis; data recovering model; electronic system performance degradation prediction; hidden Markov model; incomplete measurement data; life-cycle historical degradation sequence; log-likelihood ratios; multiunit system; principal component analysis; support vector regression; Analytical models; Biological system modeling; Data models; Degradation; Hidden Markov models; Predictive models; Principal component analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
E-Product E-Service and E-Entertainment (ICEEE), 2010 International Conference on
Conference_Location :
Henan
Print_ISBN :
978-1-4244-7159-1
Type :
conf
DOI :
10.1109/ICEEE.2010.5661236
Filename :
5661236
Link To Document :
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