DocumentCode :
53736
Title :
2.4-GHz 10-Mb/s BFSK Embedded Transmitter With a Stacked-LC DCO for Wireless Testing Systems
Author :
Chi-Ying Lee ; Chih-Cheng Hsieh ; Jenn-Chyou Bor
Author_Institution :
Nat. Tsing Hua Univ., Hsinchu, Taiwan
Volume :
21
Issue :
9
fYear :
2013
fDate :
Sept. 2013
Firstpage :
1727
Lastpage :
1737
Abstract :
A 2.4-GHz industrial scientific and medical band binary frequency-shift-keying transmitter embedded in the Hypothesis, Odyssey, and Yield (HOY) wireless test system is presented and implemented, based on a 0.18-μm CMOS process. With the digitally controlled oscillator (DCO) using a stacked-LC tank, this transmitter occupies an area of only 0.1 mm2 and has a measured phase noise of -111.8 dBc/Hz at a 500-kHz offset. The effects of stacking a spiral inductor over the other circuits are considered and examined using two DCO test chips. Both the antenna and the power amplifier are eliminated as a result of the short distance of transmission. By adopting an open-loop modulation architecture, a data rate of 10 Mb/s can be achieved. For a supply voltage of 1.5 V, the power consumption is only 9.2 mW and the emission output power measured at a distance of 1 cm is greater than -60 dBm.
Keywords :
CMOS analogue integrated circuits; LC circuits; UHF oscillators; frequency shift keying; phase noise; radio transmitters; BFSK embedded transmitter; CMOS process; DCO test chip; HOY wireless test system; binary frequency shift keying transmitter; bit rate 10 Mbit/s; digitally-controlled oscillator; distance 1 cm; frequency 2.4 GHz; hypothesis-odyssey-yield wireless test system; industrial scientific-medical band BFSK transmitter; open-loop modulation architecture; phase noise; power 9.2 mW; size 0.18 mum; spiral inductor; stacked-LC DCO; stacked-LC tank; voltage 1.5 V; Capacitance; Couplings; Inductors; Testing; Transmitters; Varactors; Wireless communication; Binary frequency-shift-keying transmitter; digitally controlled oscillator; open-loop modulation; stacked-LC structure; wireless test;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2012.2217765
Filename :
6327695
Link To Document :
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