DocumentCode :
538614
Title :
Sensors integration in embedded systems
Author :
Pakala, Hara Gopal Mani ; Khan, Ibrahim ; Raju, K.V.S.V.N.
Author_Institution :
Vignana Bharathi Inst. of Technol., Ghatkesar, India
fYear :
2010
fDate :
Nov. 29 2010-Dec. 1 2010
Firstpage :
1
Lastpage :
5
Abstract :
Sensors/actuators are critical components of several Complex Embedded Systems (CES). In these CES a fault in the sensors or actuators can trigger the incidence of catastrophic events. Sensor/actuator faults detection is difficult and impacts critically the system performance. Subsystem or Embedded Processing Component (EPC), integration testing with sensor or actuator is required to assure that the `Subsystem under test (SUT)´ meets the specifications. Several researchers have addressed software integration issues only; however sensors/actuators integration issues were not addressed adequately. This paper focuses on the integration testing of sensors/actuators in ES. The sensor integration with EPC is viewed as identification of faulty communication channel within SUT. The Sensor and EPC models are developed based on and are modified for incorporating faults in the communication channel between them. A faulty communication channel is modelled by a “faulty process Ψ” that changes the operations or possibly modifies events between the fault-free processes, while the components are assumed to be fault free. The functional tests are important in verifying system and their reuse in integration testing correctly identifies the known and tested system requirements. Comparing the observed output in the communication channel with expected response identifies the fault(s) in the channel and provides integration test verdict: pass or fail. An example illustrates the application of functional testing for integration of sensor.
Keywords :
electric actuators; electric sensing devices; embedded systems; fault location; finite state machines; telecommunication channels; EPC; actuator fault detection; catastrophic event; complex embedded system; embedded processing component; fault free process; faulty communication channel; functional testing; sensor fault detection; sensor integration testing; software integration; Complex Embedded System; Sensor / actuator model; faulty communication channel; functional testing; sensor/ actuator integration in ES;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power, Control and Embedded Systems (ICPCES), 2010 International Conference on
Conference_Location :
Allahabad
Print_ISBN :
978-1-4244-8543-7
Type :
conf
DOI :
10.1109/ICPCES.2010.5698681
Filename :
5698681
Link To Document :
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