• DocumentCode
    538913
  • Title

    Development of Full Digital Platform of Dynamic Test and Analysis System and Its Applications

  • Author

    Zhao, J.Y. ; Ding, W.H.

  • Author_Institution
    Dept. of Comput. Eng., HYIT, Huai´an, China
  • Volume
    2
  • fYear
    2010
  • fDate
    16-17 Dec. 2010
  • Firstpage
    207
  • Lastpage
    210
  • Abstract
    To finally use of dynamical testing and analytical, a new platform is presented in this paper. It is based on Σ-ΔADC DAC and DSP, with high performance of 24 bits resolution in each of 8 channels and many functions of digital signal acquisition, signal processing, signal sources producing and data transmitting. The test performances are given in picture and table. The digital signal processing involves FFT, Zoom-FFT, power spectral density (PSD) and some of new algorithms as wavelet and sub band-wavelet FFT and others. The signal sources can produce many usual kinds of waveform. All the data can be transmitted to/from PC application, designed for data displaying, secondary signal processing, signal source controlling and the interface between the users and PC via USB2.0 devices. The application systems can be used in vibration, shock and noise test.
  • Keywords
    digital signal processing chips; digital-analogue conversion; dynamic testing; fast Fourier transforms; sigma-delta modulation; signal detection; test equipment; user interfaces; wavelet transforms; ADC; DAC; DSP; USB2.0 devices; data transmission; digital signal acquisition; digital signal processing; dynamical testing; power spectral density; secondary signal processing; signal sources; subband wavelet FFT; zoom-FFT; Cutoff frequency; Digital filters; Digital signal processing; Frequency synchronization; Instruments; Testing; Vibrations; Digital signal processing; Dynamical test and analysis; Sigma-delta modulation; Synthesis waveform; Test instrument;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Systems (GCIS), 2010 Second WRI Global Congress on
  • Conference_Location
    Wuhan
  • Print_ISBN
    978-1-4244-9247-3
  • Type

    conf

  • DOI
    10.1109/GCIS.2010.182
  • Filename
    5709165