DocumentCode
538913
Title
Development of Full Digital Platform of Dynamic Test and Analysis System and Its Applications
Author
Zhao, J.Y. ; Ding, W.H.
Author_Institution
Dept. of Comput. Eng., HYIT, Huai´an, China
Volume
2
fYear
2010
fDate
16-17 Dec. 2010
Firstpage
207
Lastpage
210
Abstract
To finally use of dynamical testing and analytical, a new platform is presented in this paper. It is based on Σ-ΔADC DAC and DSP, with high performance of 24 bits resolution in each of 8 channels and many functions of digital signal acquisition, signal processing, signal sources producing and data transmitting. The test performances are given in picture and table. The digital signal processing involves FFT, Zoom-FFT, power spectral density (PSD) and some of new algorithms as wavelet and sub band-wavelet FFT and others. The signal sources can produce many usual kinds of waveform. All the data can be transmitted to/from PC application, designed for data displaying, secondary signal processing, signal source controlling and the interface between the users and PC via USB2.0 devices. The application systems can be used in vibration, shock and noise test.
Keywords
digital signal processing chips; digital-analogue conversion; dynamic testing; fast Fourier transforms; sigma-delta modulation; signal detection; test equipment; user interfaces; wavelet transforms; ADC; DAC; DSP; USB2.0 devices; data transmission; digital signal acquisition; digital signal processing; dynamical testing; power spectral density; secondary signal processing; signal sources; subband wavelet FFT; zoom-FFT; Cutoff frequency; Digital filters; Digital signal processing; Frequency synchronization; Instruments; Testing; Vibrations; Digital signal processing; Dynamical test and analysis; Sigma-delta modulation; Synthesis waveform; Test instrument;
fLanguage
English
Publisher
ieee
Conference_Titel
Intelligent Systems (GCIS), 2010 Second WRI Global Congress on
Conference_Location
Wuhan
Print_ISBN
978-1-4244-9247-3
Type
conf
DOI
10.1109/GCIS.2010.182
Filename
5709165
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