Evaluation Method for Effective Resolution of Measurement System Based on Sub-pixel

Author

Li´Na, Yang ; Wenhua, Cui

Author_Institution

Jiaxing Univ. of Mech. & Electr. Eng., Jiaxing, China

Volume

2

fYear

2011

fDate

6-7 Jan. 2011

Firstpage

80

Lastpage

82

Abstract

In this paper, an evaluation method for effective resolution of measurement system is designed based on ANOVA and Correlation analysis. An evaluation platform based on this method is designed. Finally, constructs an machine vision detection system of ceramic substrates, evaluates sub-pixel method of advanced Sobel operator and three - order spline interpolation function, and calculates the actual accuracy of sub-pixel method applied to machine vision inspection system.

Keywords

computer vision; correlation methods; image resolution; interpolation; object detection; splines (mathematics); statistical analysis; ANOVA; Sobel operator; correlation analysis; evaluation method; machine vision detection system; machine vision inspection system; measurement system effective resolution; spline interpolation function; subpixel method; Automation; Mechatronics; ANOVA; Correlation Analysis; Effective Rresolution; Machine Vision; Sub-pixel;

fLanguage

English

Publisher

ieee

Conference_Titel

Measuring Technology and Mechatronics Automation (ICMTMA), 2011 Third International Conference on

Conference_Location

Shangshai

Print_ISBN

978-1-4244-9010-3

Type

conf

DOI

10.1109/ICMTMA.2011.307

Filename

5721021