Title :
Finite Element Analysis of Biaxial Scanning Device Based on Integrated Simulation Technique
Author :
Minjian, Sheng ; Pengjun, Zhang ; Jing, Qian
Author_Institution :
Shanghai Inst. of Tech. Phys., Shanghai, China
Abstract :
A thermal analysis was performed on a biaxial scanning device of a 3-axis stability satellite to get the temperature variations of the device. The temperature field, which represents worst working condition, was imported to a structural model as a set of boundary condition. A few optical parameters were separated from the deformation results of the structural analysis to evaluate the thermal controlling system inside the device, and furthermore to provide some useful design data.
Keywords :
artificial satellites; boundary-elements methods; finite element analysis; structural engineering; thermal analysis; biaxial scanning device; boundary condition; finite element analysis; integrated simulation; stability satellite; structural analysis; structural model; thermal analysis; thermal controlling system; Boundary conditions; Computational modeling; Mirrors; Satellites; Shafts; Silicon carbide; Thermal analysis; 3-axis stability satellite; Integrated Simulation; biaxial scanning device;
Conference_Titel :
Measuring Technology and Mechatronics Automation (ICMTMA), 2011 Third International Conference on
Conference_Location :
Shangshai
Print_ISBN :
978-1-4244-9010-3
DOI :
10.1109/ICMTMA.2011.342
