• DocumentCode
    539733
  • Title

    Imaging System Effects on the Measuring Accuracy of the Optical Surface in Interferometer

  • Author

    Wang, Yang ; Manlin, Liu ; Weicai, Xu

  • Author_Institution
    Changchun Inst. of Opt., Fine Mech. & Phys., Chinese Acad. of Sci., Changchun, China
  • Volume
    2
  • fYear
    2011
  • fDate
    6-7 Jan. 2011
  • Firstpage
    363
  • Lastpage
    365
  • Abstract
    In order to measure high accuracy or mid spatial frequency optical surfaces, this study investigated imaging system in Fizeau interferometer. Interferometer is a transferring phase information system. General transfer function can´t evaluate the ability of imaging system in interferometer that transfers the phase information of the optical surface. So this paper deduced instrument transfer function (ITF) and used ITF to evaluate the phase information transfer ability of interferometer. We obtained some results about ITF of imaging system by numerical simulation when there are different aberrations in imaging system or measuring optical surfaces were different. Our results indicate that ITF can evaluate the ability of transferring phase information in interferometer and the distortion of imaging system evidently affects the accuracy of interferometric measurements.
  • Keywords
    aberrations; light interferometry; numerical analysis; optical distortion; optical images; optical transfer function; Fizeau interferometer; imaging system effects; instrument transfer function; interferometric measurements; midspatial frequency; numerical simulation; optical surface; transferring phase information system; Adaptive optics; Optical distortion; Optical imaging; Optical interferometry; Optical surface waves; Optical variables measurement; Imaging System; Instrument Transfer Function; Interferometer; Optical Surface Measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Measuring Technology and Mechatronics Automation (ICMTMA), 2011 Third International Conference on
  • Conference_Location
    Shangshai
  • Print_ISBN
    978-1-4244-9010-3
  • Type

    conf

  • DOI
    10.1109/ICMTMA.2011.377
  • Filename
    5721195