DocumentCode
539751
Title
Life Prediction for Vacuum Fluorescent Display Based on Curve Fitting of Brightness Decay
Author
Jianping, Zhang ; Zhijiang, Yan ; Wenli, Wu ; Wenqing, Zhu
Author_Institution
Shanghai Univ. of Electr. Power, Shanghai, China
Volume
2
fYear
2011
fDate
6-7 Jan. 2011
Firstpage
473
Lastpage
475
Abstract
In order to estimate the life-time of vacuum fluorescent display (VFD) in a short time, a constant stress accelerated life test was performed by increasing its cathode temperature. The fitting of the brightness decay curve for VFD was achieved by applying the Weibull function to describe the brightness decay and the Least Square Method (LSM) to estimate the distribution parameters. Furthermore, the brightness decay formula in the normal stress, which was employed to design the initial brightness for the VFD according to life-time requirements of the users, was determined by the acceleration parameter. The numerical results show that the predicted life-time has a high accuracy, and that the brightness decay formula can provide some significant guideline to manufacturers and technicians for life-time estimation and initial brightness design.
Keywords
Weibull distribution; brightness; curve fitting; display devices; least squares approximations; life testing; VFD; Weibull function; acceleration parameter estimation; brightness decay curve fitting; brightness decay formula; cathode temperature; constant stress accelerated life test; least square method; life prediction; life time estimation; normal stress; parameter estimation; vacuum fluorescent display; Brightness; Fitting; Fluorescence; Life estimation; Stress; Vacuum technology; Brightness Decay; Life Prediction; Vacuum Fluorescent Display; Weibull Function;
fLanguage
English
Publisher
ieee
Conference_Titel
Measuring Technology and Mechatronics Automation (ICMTMA), 2011 Third International Conference on
Conference_Location
Shangshai
Print_ISBN
978-1-4244-9010-3
Type
conf
DOI
10.1109/ICMTMA.2011.405
Filename
5721223
Link To Document