• DocumentCode
    540394
  • Title

    Discussions on microwave measurement of permittivity anisotropy in the plane of dielectric laminate substrates

  • Author

    Wadayama, Shuhei ; Kobayashi, Yoshio ; Ma, Zhewang

  • Author_Institution
    SAITAMA Univ., Saitama, Japan
  • fYear
    2010
  • fDate
    7-10 Dec. 2010
  • Firstpage
    1773
  • Lastpage
    1776
  • Abstract
    This paper proposes a method to measure permittivity anisotropy in the plane of dielectric laminate substrates by utilizing orthogonality of TE111 mode in a circular cavity resonator. For cyclo-olefin polymer (COP), liquid crystal polymer (LCP) and glass cloth PTFE substrates, the permittivity anisotropy in the plane is measured by this method. As a result, usefulness of this method is verified by the measured results of these three samples.
  • Keywords
    cavity resonators; glass; liquid crystal polymers; microwave measurement; permittivity measurement; PTFE substrates; circular cavity resonator; cycloolefin polymer; dielectric laminate substrates; glass cloth; liquid crystal polymer; microwave measurement; permittivity anisotropy; Cavity resonators; Frequency measurement; Permittivity; Permittivity measurement; Resonant frequency; Substrates; Relative permittivity; anisotropy in the plane; circular cavity resonator;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference Proceedings (APMC), 2010 Asia-Pacific
  • Conference_Location
    Yokohama
  • Print_ISBN
    978-1-4244-7590-2
  • Electronic_ISBN
    978-1-902339-22-2
  • Type

    conf

  • Filename
    5728271
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=540394